Highly Accurate Thickness Determination of 2D Materials

Determining the thickness of two-dimensional (2D) materials accurately and reliably is highly necessary for multiple investigations, but at same time it can be quite complex. Most studies in this field measure a topographic map edge 2D material using an atomic force microscope (AFM), plot single-line cross-section software AFM. However, method inaccurate result high relative errors due to surface roughness line-to-line variability. This even more important ultrathin (<4 nm) grown by chemical vapor deposition, as these exhibit larger (compared mechanically exfoliated) density local defects. Here shown that determined statistically with accuracy reliability very easy way plotting histogram height plot. Using should enhance investigations research papers materials.